Synthesis and Real Structure Group

Scanning electron microscope

Zeiss Gemini Ultra55 Plus

In a scanning electron microscope (SEM) a fine bundled electron beam is scanned over an object.
When the electrons hit the object they are slowed down and release kinetic energy.
Secondary electrons are released out of the object, which can be detected.
They are often used for imaging.
Further signals which can be detected are for example backscatter electrons and x-rays.