Synthesis and Real Structure Group


Transmission Electron Microscopy (TEM) is used to create magnified images of a specimen with a highly charged electron beam. While the specimen is very thin and the electron beam has very high energy, the electrons pass through the specimen. The interactions of the electrons with the specimen form a magnified characteristic image of intensities which can be detected. The different interaction possibilities leads to a huge range of possibilities to characterize inorganic materials and also organic materials. TEM has not reached its peak level of importance so far so at the moment there is still a growing number of developments in methods and instruments. The high resolution is not the only advantage. It also offers nano-focussing on defined sample areas and a complete material characterization in one measuring instrument. This makes it to an universal tool used in universities and research institutes.

TEM methods and techniques


Tecnai F30 G2  
 FEI Tecnai F30                                                   Jeol JEM-2100


Sample Preparation


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